HRTEM, XPS and XRD characterization of ZnS/PbS nanorods prepared by thermal evaporation technique
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چکیده
منابع مشابه
Structural & Optical Characterization of Gex Se80-x Pb20 Thin Films Prepared by Thermal Evaporation Technique
Vacuum evaporated films of GexSe80-xPb20 have been characterized by using optical spectroscopy (especially transmission and absorption spectra). The chalcogenide glass of GexSe80-xPb20 has been prepared by melt quenching technique. Thin films of GexSe80-xPb20 are deposited by vacuum thermal evaporation technique on highly clean glass substrates and their optical properties such as refractive in...
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In this research, tellurium (Te) film with thicknesses of 100-250 nm were deposited on ceramic substrates by thermal evaporation at 373 K. The thickness of the film was determined by Rutherford backscattering spectroscopy. The influence of the thickness on the structural, morphological and molecular bonds was characterized using XRD, scanning electron microscope, and Raman spectroscopy. The XRD...
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SiOx thin films with different stoichiometries from SiO1.3 to SiO1.8 have been prepared by evaporation of silicon monoxide in vacuum or under well-controlled partial pressures of oxygen sP,10−6 Torrd. These thin films have been characterized by x-ray photoemission and x-ray-absorption spectroscopies, this latter at the Si K and L2,3 absorption edges. It has been found that the films prepared in...
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ژورنال
عنوان ژورنال: Nanosystems: Physics, Chemistry, Mathematics
سال: 2020
ISSN: 2220-8054
DOI: 10.17586/2220-8054-2020-11-5-537-545